ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,239, issued on Oct. 20, was assigned to NEC Corp. (Tokyo). "Object evaluation apparatus, object evaluation method, and non-transitory compu... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,240, issued on Oct. 20, was assigned to Boon Logic Inc. (Minneapolis). "Product inspection system and method" was invented by Brian Turnqui... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,241, issued on Oct. 20, was assigned to The Boeing Co. (Arlington, Va.). "Cable wire insertion depth monitoring" was invented by Darren Cha... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,242, issued on Oct. 20, was assigned to Kioxia Corp. (Tokyo). "Semiconductor image processing apparatus and semiconductor image processing ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,243, issued on Oct. 20, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea). "Module and system for, and method of detecting ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,244, issued on Oct. 20, was assigned to FUJI Corp. (Chiryu, Japan). "Component mounting system and image classification method" was invente... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,245, issued on Oct. 20, was assigned to Lam Research Corp. (Fremont, Calif.). "Automated visual-inspection system" was invented by Collin M... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,246, issued on Oct. 20, was assigned to HON HAI PRECISION INDUSTRY Co. LTD. (New Taipei City, Taiwan) and Foxconn Technology Group Co. Ltd. ... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,247, issued on Oct. 20, was assigned to CANON K.K. (Tokyo). "Inspection apparatus and inspection system" was invented by Makoto Anno (Tokyo... Read More
ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,248, issued on Oct. 20, was assigned to AUROS Technology Inc. (Hwaseong-si, South Korea). "Overlay measurement apparatus and overlay measur... Read More